Computer-implemented methods for time-domain reflectometry analysis of objects
The presented simulation-based time-domain reflectometry (TDR) methods enable a significantly more precise, iterative analysis of electrical transmission lines and other conductor-like structures by systematically factoring out multiple reflections and frequency-dependent dispersivity.
Challenge
Time-domain reflectometry (TDR) is a method for determining and analyzing the propagation lengths and reflection characteristics of electromagnetic waves and signals in electrical transmission lines, cables or other media with dispersed electrical properties. A pulse signal is sent along the line, and the reflections caused by changes in the impedance are observed. TDR can be used as a cable radar in order to detect and locate cable crimps, cable breaks or in general defects in power lines and electrical transmission lines. The time interval between the transmission and reception of a wave or a (partial) reflection, can, after conversion into the distance traveled, provide information about the location of a defect. However, a limitation in TDR measurements is that only the first major reflection can be resolved properly or precisely, so that only these reflections travel back to the transmitter undisturbed. All subsequent reflections are distorted by so-called multiple reflections.
Our Solution
The presented invention provides a set of simulation-based TDR methods and a software in order to overcome the above mentioned challenges and to systematically factor out multiple reflections and frequency-dependent dispersivity in electrical transmission lines and other conductor-like structures. The starting point is a conventional TDR measurement signal and its reflection response, which are recorded and subsequently iteratively replicated in a simulation until the simulated reflection signal sufficiently matches the measured signal. The core concept is an object simulation that approximates the real object using many short transmission line segments in the frequency domain and is subjected to a simulated measurement signal via Fourier transforms. Deviations between the measured and simulated reflection signals are assigned to the segment parameters (impedance, losses and dispersivity) via correction signals and adjusted step by step until multiple reflections and superimposed effects are eliminated.
Illustration of the computer-implemented methods for TDR analysis of electronics (image generated with Perplexity AI).
Advantages
- Improved defect detection and location
- Consideration of dispersivity and losses in the context of TDR measurements
- Robust, iterative, simulation-based approach
- Reduced computing effort
- Flexible integration into existing TDR hardware
Applications
- Testing of high-frequency printed circuit boards (signal integrity)
- Quality assurance of cables and wiring systems
- Fault diagnosis in concealed, hard-to-reach lines
- Embedded and in-line monitoring
Development Status
The software and the simulation-based methods have been successfully tested. Prototypes are available.
Patent Status
German patent applications and PCT applications filed.
Patent holder: Ostfalia University of Applied Sciences (Wolfenbüttel, Germany)
Contact
Dr. Mirza Mackovic
Patent & Innovation Manager Technology
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Tel.: +49 551 30724 153
Reference:
MM-2275-FHBW
CPA-2510-FHBW
CPA-2582-FHBW
CPA-2636-FHBW
Published: January 7, 2026.
Tags: IT und Software, Mess- und Analysetechnik, Physik und Technik & Software
