Fast and sample-friendly aberration correction for STED microscopy
A simple metric, based on local changes in the fluorescence lifetime was found to reflect the quality of the STED focus. This metric can be used to correct abberations fast, on-line and continuously over the whole image, using a simple deformable mirror and an elaborated algorythm.
Fast and sample-friendly aberration correction for STED microscopy
A simple metric, based on local changes in the fluorescence lifetime was found to reflect the quality of the STED focus. This metric can be used to correct abberations fast, on-line and continuously over the whole image, using a simple deformable mirror and an elaborated algorythm.