STED

Aberration correction for STED microscopy

Fast and sample-friendly aberration correction for STED microscopy

A simple metric, based on local changes in the fluorescence lifetime was found to reflect the quality of the STED focus. This metric can be used to correct abberations fast, on-line and continuously over the whole image, using a simple deformable mirror and an elaborated algorythm.

read more

Aberration correction for STED microscopy

Fast and sample-friendly aberration correction for STED microscopy

A simple metric, based on local changes in the fluorescence lifetime was found to reflect the quality of the STED focus. This metric can be used to correct abberations fast, on-line and continuously over the whole image, using a simple deformable mirror and an elaborated algorythm.

read more

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Georg-August-Universität Göttingen